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    • 摘要: 利用超短激光脉冲泵浦半导体表面或者半导体异质结可以产生太赫兹脉冲辐射。基于超短激光脉冲泵浦金属-绝缘体-半导体异质结的太赫兹辐射产生物理模型,通过数值模拟和理论分析研究了载流子密度和速度在半导体内部的变化规律,分析了超短激光脉宽、载流子寿命以及半导体厚度等参数对太赫兹辐射的影响和物理机制。结果显示,超短激光脉宽的增加会提高太赫兹脉冲的幅值,降低太赫兹脉冲中心频率和半峰全宽;载流子寿命和半导体材料厚度的增加对太赫兹辐射的中心频率和半峰全宽有不同程度的降低作用。通过分析不同参数对产生太赫兹辐射的影响,获得了该作用过程优化宽带太赫兹脉冲产生的途径和参数。本文结果对开展相关实验提供了较好的理论参考。

       

      Abstract: Terahertz pulse radiation can be generated by pumping semiconductor surfaces or semiconductor heterojunctions with ultrashort laser pulses. Based on the model of terahertz generation from metal-insulator-semiconductor heterostructure pumped by ultrashort laser pulses, the changes of carrier density and velocity in semiconductors are studied through numerical simulations and theoretical analysis. The influences and physical mechanisms of ultrashort laser pulse duration, carrier lifetime, and semiconductor thickness on the terahertz generation are analyzed as well. The results show that the increase of the laser pulse duration increases the amplitude of the terahertz pulse but decreases its central frequency and bandwidth. The increases of the carrier lifetime and thickness of the semiconductor have different influences on the central frequency and bandwidth of terahertz pulse. By analyzing the influence of different parameters on the terahertz generation, the pathways and parameters of optimizing the terahertz generation are obtained. The results of this paper provide a good theoretical reference for the related experiments.