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    • 摘要: Zernike多项式因其正交性和旋转不变性,被广泛应用于光学表面的表征和优化中。它能够有效地减少拟合误差,并通过少量的系数实现对复杂曲面的高精度描述,有助于提升光学系统的成像质量和简化性能分析。本文首先对自由曲面描述方法进行了概括,包括全局描述与局部描述两种方式;随后讨论了国内外关于Zernike多项式在曲面表征中的研究进展,探讨了Zernike多项式在曲面表征中的实际应用;最后展望了Zernike多项式在曲面表征领域的发展前景。

       

      Abstract: Zernike polynomials, due to their orthogonality and rotational invariance, are widely used in the characterization and optimization of optical surfaces. They can effectively reduce fitting errors and provide high-precision descriptions of complex surfaces with only a few coefficients, contributing to improved imaging quality and simplified performance analysis in optical systems. This paper provides an overview of freeform surface description methods, including both global and local approaches. It discusses the research progress on Zernike polynomials in surface characterization, both domestically and internationally, explores their practical applications in this field, and finally anticipates the future prospects of Zernike polynomials in surface characterization.