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Li XT, Cai XD, Liu C et al. Cascaded metasurfaces enabling adaptive aberration corrections for focus scanning. Opto-Electron Adv 7, 240085 (2024). doi: 10.29026/oea.2024.240085
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Cascaded metasurfaces enabling adaptive aberration corrections for focus scanning
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Abstract
Scanning focused light with corrected aberrations holds great importance in high-precision optical systems. However, conventional optical systems, relying on additional dynamical correctors to eliminate scanning aberrations, inevitably result in undesired bulkiness and complexity. In this paper, we propose achieving adaptive aberration corrections coordinated with focus scanning by rotating only two cascaded transmissive metasurfaces. Each metasurface is carefully designed by searching for optimal phase-profile parameters of three coherently worked phase functions, allowing flexible control of both the longitudinal and lateral focal position to scan on any custom-designed curved surfaces. As proof-of-concept, we engineer and fabricate two all-silicon terahertz meta-devices capable of scanning the focal spot with adaptively corrected aberrations. Experimental results demonstrate that the first one dynamically scans the focal spot on a planar surface, achieving an average scanning aberration of 1.18% within the scanning range of ±30°. Meanwhile, the second meta-device scans two focal points on a planar surface and a conical surface with 2.5% and 4.6% scanning aberrations, respectively. Our work pioneers a breakthrough pathway enabling the development of high-precision yet compact optical devices across various practical domains.-
Keywords:
- terahertz /
- focus scanning /
- aberration correction /
- dielectric metasurface
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References
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Li XT, Cai XD, Liu C et al. Cascaded metasurfaces enabling adaptive aberration corrections for focus scanning. Opto-Electron Adv 7, 240085 (2024). doi: 10.29026/oea.2024.240085
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Figure 1.
Schematic of the cascaded metasurfaces enabling adaptive aberration corrections for focus scanning. (a) Overview of cascaded metasurfaces, consisting of two layers of mechanically rotated transparent metasurfaces (with rotation angle α1 and α2, respectively), is capable of dynamically scanning the focal spot on the custom-designed aberration-corrected scanning surface (purple surface) compared to the aberration-uncorrected scanning surface (blue surface). Here, rc represents the position of focal spot, and θc and φc represent the polar angle and azimuth angle of focal spot. Insets illustrate the intuitive physical picture of the typical origin of scanning aberrations, using hyperbolic scanning lenses an example (blue panel), and how to adaptively correct these scanning aberrations with the coherent interplay between three different phase functions (purple panel). (b) Photograph of fabricated meta-device with two-layer all-silicon metasurfaces fixed in a motorized rotation stage. (c) Scanning electron microscope (SEM) image of the fabricated metasurface samples.
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Figure 2.
Searching algorithm for optimal phase-profile parameters. (a) Schematic of meta-device for adaptively corrected planar scanning. (b) The theoretical working efficiency η varies with φ0 and Δα, where the total phase profiles Φtot (α1, α2, r) for different rotation angle {α1, α2} are depicted as the right panel. (c) The average working efficiency
$ \bar{\text{\eta} } $ $ \bar{\text{\eta} } $ $ \bar{\text{\delta }} $ -
Figure 3.
The experimental setup and terahertz characteristics of the meta-device for adaptively corrected planar scanning. (a) Schematics of the experimental setup, with the theoretical phase profiles and the top view SEM of each layer in the right. (b) Theoretical (dashed), simulated (solid) and experimental (dotted) results of longitudinal focal position for adaptively corrected planar scanner (blue) compared with hyperbolic scanning lenses (black). Experimental (c) and simulated (d) intensity distributions on xz-plane (top) and xy-plane (middle) corresponding to different Δα, and the intensity profiles along the diameter (bottom) at the focal plane with the full width at half maximum (FWHM) marked. Here, the grey dashed lines in (c) and (d) represent the position of the maximum intensity of focal spot.
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Figure 4.
Terahertz characteristics of the adaptively corrected dual-focus scanner. (a) Design strategy of the meta-device for scanning two focal spots in different scanning surfaces, with the theoretical phase profiles and the top view SEM of each layer in the right. (b) Theoretical (dashed), simulated (solid) and experimental (dotted) results of the position for focal spot A (blue) and B (pink) of the adaptively corrected dual-focus scanner. The blue plane and pink plane are two vertical planes at the azimuthal angle 0° and 30°. (c–f) Experimental intensity distributions on two vertical planes (top) for two focal spots at the azimuthal angle 0° (dashed blue) and 30° (dashed pink) corresponding to different Δα, with two horizontal planes (bottom left) at focal plane for focal spot A (solid blue) and B (solid pink). The intensity profiles along the diameter (bottom right) at the focal plane with the FWHM marked.
