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Supplementary information for Ultra-high extinction-ratio light modulation by electrically tunable metasurface using dual epsilon-near-zero resonances |
Schematic of the tunable double ITO capacitive structure.
Electron concentrations in the (a) top and (b) bottom ITO films as functions of the applied voltage. The electron concentration along the Z axis, 50 nm < Z < 55 nm in the top ITO film and −5 nm < Z < 0 nm in the bottom ITO film. The initial electron concentration for both films equal to N0 = 8.22 × 1020 cm−3 is shown in green color. The increased electron concentration is shown with red color in the accumulation layer of the top ITO film and the decreased electron concentration is shown with blue color in the depletion layer of the bottom ITO film.
Optical properties of ITO film as functions of the applied voltage. The optical properties of the ITO film interface with the BST film in three different conditions. Na represents the optical property of the accumulation layer, Nd represents the optical property of the depletion layer, and N0 represents the optical property of interface without bias voltage (un-biased) and all other parts of the ITO film. (a) The real part of the permittivity
Schematic of the electrically controlled reflective modulator metasurface. (a) A square unit cell is constructed from a circular silicon resonator on the top of a circular ITO-BST-ITO resonator on the top of a silver mirror. Four symmetrical bias connections with the same layers are used to make bias connections between the ITO films. Parameter values are tAg =100 nm, tITO = 5 nm, tBST = 50 nm, tSi = 50 nm, W = 20 nm, D = 250 nm, and P = 520 nm. The initial polarization of light is shown along the X axis. (b) 3D schematic of the metasurface constructed from a 6×6 array of unit cells. The metasurface is controlled by applying the voltage between the bottom silver film (grey) and the top ITO electrode (orange). The electrical current passes to the resonators through a 2D array of bias connections.
Performance of the electrically tunable modulator metasurface. (a) Simulated reflection spectra of the modulator under three different voltages. Under V = 0 V bias voltage, both ITO films have an electron concentration of N0. Under V = −2.5 V, the top ITO film has a 0.5 nm thick accumulation layer with an electron concentration of Na and the bottom ITO film has a 1 nm thick depletion layer with an electron concentration of Nd. Under V = 2.5 V, the top ITO film has a depletion layer with an electron concentration of Nd and the bottom ITO film has an accumulation layer with an electron concentration of Na. (b) Modulation depth spectra of modulator under V = −2.5 V. The modulation depth peaks to ~84 dB at the wavelength of λ = 820 nm.
Electric field intensity along XZ plane under the bias voltages of (a) V = 0 V at λ = 820 nm, (b) V = 2.5 V at λ = 800 nm, and (c) V = −2.5 V at λ = 820 nm. The edges of the Si disc and silver mirror are shown with green dashed lines.
The electric and magnetic fields under a bias voltage of V = −2.5 V inside the accumulation layer at λ = 820 nm. (a) Electric and (b) magnetic field intensities in the XY plane inside the accumulation layer in the top ITO film. Top view of the vectors of the (c) electric and (d) magnetic fields from the same monitor. Side view of the vectors of the (e) electric and (f) magnetic fields from the same monitor. The vector figures (e) and (f) share the same scalar bar as vector figures (c) and (d), respectively. The edge of the ITO disc is shown by the red dashed lines.
Impact of the Si disc thickness on the reflection spectra. Map of the reflection spectra of the modulator metasurface with a varying thickness of the Si disc (0 nm ≤ tSi ≤ 50 nm) under the bias voltages of (a) V = 0 V and (b) V = −2.5 V.