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Overview: Topological materials are new types of quantum metamaterials with metal surface states and insulator states that have been predicted and observed in recent years. The polarization conversion phenomenon caused by the Kerr effect and the Faraday effect of topological insulator can be used as a polarization-separation or polarization-conversion device, and thus it is important to study the polarization properties of the topological insulator.
Polarization, as one of the basic characteristics of electromagnetic waves, plays an important role in communication systems such as antennas. With the diversification of application scenarios, we need to control the polarization state of electromagnetic waves. Therefore, the exploration of the polarization performance of new materials is also a continuous and important subject. The current work of TI materials is limited to the common isotropic medium-topological insulator interface, which has strict requirements on the dielectric constant, and the current TI materials cannot meet it. Thus we discussed the polarization control performance of the double-topology insulator interface model, which has a certain tolerance for the dielectric constant of the material and can increase the selectivity of TI materials.
In this paper, an interface transmission model of plane wave oblique incidence to two topological insulators is established, and the linear polarization conversion characteristics of reflected waves are discussed. The calculation results prove that the model can achieve complete transformation of polarization under certain parameter settings, and the polarization conversion property can be explained by Kerr effect. Besides, we show the design method of polarization conversion devices to realize super strong angular stability. This research provides a theoretical reference for the application of topological insulators in polarized devices.
Transmission model diagram of the TI1-TI2 interface
The results of the polarization conversion in the reflection field at the oblique incidence of the s-wave at the TI1-TI2 interface when ε1=60. (a) Direct reflectivity |rss|2; (b) Cross-polarized reflectivity |rsp|2; (c) Polarization conversion ratios (PCR)
Under the condition of ε2>ε1>0, results of the polarization conversion in the reflection field at the oblique incidence of the p-wave at the TI1-TI2 interface when ε1=31. (a) Direct reflectivity |rpp|2; (b) Cross-polarized reflectivity |rps|2; (c) Polarization conversion ratios(PCR)
Under the condition of ε2≤ε1-7.57N2, results of the polarization conversion in the reflection field at the oblique incidence of the p-wave at the TI1-TI2 interface when ε1=70. (a) Direct reflectivity |rpp|2; (b) Cross-polarized reflectivity |rps|2; (c) Polarization conversion ratios(PCR)
Performance of two polarizers with strong angular stability
Direct reflectivity |rss|2 for different incident angles when N=0 and ε1=9