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Overview: Spectral sensitivity is one of the most important characteristics of photosensitive materials, which represents the photographic effect of photosensitive materials on radiation of different wavelengths. There are many kinds of instruments used to measure the spectral sensitivity curves of photosensitive materials, but these instruments are old, cumbersome and inefficient. In addition, because of the low energy of ultraviolet band and the uneven distribution of the light intensity on the spectral surface, the equipment, which is built by improving the spectrograph, cannot be used to draw the photosensitive curve of photosensitive materials. Therefore, a new type of spectrosensitometer has been developed, which is made up of a homemade 110 mm × 110 mm blazed grating and a cylindrical reflector with a curvature radius of 1643.59 mm, to produce a 202 mm × 90.5 mm spectrum plane. The operating wavelength ranges from 340 nm to 900 nm. The optical density value error of each step on the 18-step wedge with high precision, which is invented by means of evaporation and ions beam etching micro-compensation technology, is not greater than 0.01. The step wedge is placed on the spectrum to form a stepped distribution (vertical direction) of the spectral intensity of each wavelength. The step wedge engraves with spectral wavelength carved lines, the positioning line and the wavelength calibration engraved line. According to the spectral characteristic of the light source, the filter film is plated in the geometric region corresponding to the band of 600 nm ~ 900 nm of the step wedge to eliminate the secondary spectrum of the grating. The film filter evaporated according to the spectral characteristic of the light source can eliminate the secondary spectrum of grating. The automatic control acquisition system is developed by LabVIEW and all-in-one PLC with HMI. The ball screws are used as vertical and horizontal displacement device. In the horizontal direction, the grating displacement sensor is adopted to form the closed-loop control, and the wavelength positioning deviation is less than 0.05 nm. Linear compensation method is adopted in the vertical direction with a height deviation of less than 0.05 mm. Spectrosensitometer automatically measures optical power of lights with different wavelengths and light intensities on the step wedge. The shutter controls exposure time. Photosensitive materials are once exposed within the scope of the wide spectrum. After being developed and fixed, the optical density value can be measured by densitometer. The spectral sensitivity curve of a photosensitive material with a certain optical density value can be drawn according to the national standard (GB10557-89).
The optical diagram of the instrument. L: Source; S: Slit; R: Reflector; M: Concave mirror; G: Grating; C: Cylindrical; D: Electronic shutter; F: Focal plane
The mercury lamp spectrogram
The step wedge
The tungsten halogen lamp spectrogram with the step wedge
The exposure result of photographic plate with secondary spectrum
The exposure result of photographic plate without secondary spectrum
The system block diagram of spectrosensitometer
Closed-loop control algorithm for horizontal position
The error of vertical scan area at the upper and lower boundaries. (a) The wavelength sampling is with an interval of 3 nm; (b) The wavelength sampling is with an interval of 10 nm
The exposure result of photographic plate with the most sensitive wavelength of 692 nm
The spectral sensitivity curve for D=1.0